- 1.
"Deep Levels
Including
Lattice Relaxation: First- and Second-Neighbor Effects," C.W. Myles and W.G. Li,
- Journal of the Physics & Chemistry of
Solids 61,
1855 (2000). [pdf]
- 2.
"Effect
of Deep Level
Impact Ionization on Avalanche Breakdown in Semiconductor p-n
Junctions,"
- S. Kang and C.W.
Myles, Physica
Status Solidi A 181, 219 (2000). [pdf]
- 3. "Steady
State Properties of
Lock-on Current Filaments in GaAs,", K.
Kambour, S. Kang, C.W. Myles,
- and H.P.
Hjalmarson, IEEE
Transactions on Plasma Science 28, 1497 (2000). [pdf]
-
(Special
Issue: Pulsed
Power Science & Technology).
- 4. "Theoretical
Calculations of
the Thermal Conductivity in Framework Semiconductors," J.
Dong,
- O.F.
Sankey, C.W. Myles, G. Ramachandran,
P.F. McMillan, and J. Gryko, Materials
Research Society
-
Symposium 626, Z6.1.1 (2000). [pdf]
- 5. "Theoretical
Study of the
Lattice Thermal Conductivity in Ge
Framework
Semiconductors," J. Dong,
- O.F. Sankey,
and C.W. Myles, Physical
Review
Letters 86,
2361 (2001).
[pdf]
- 6. "Structural
and Electronic
Properties of Tin Clathrate Materials," C.W.
Myles, J. Dong, and O.F.
Sankey,
- Physical
Review B 64,
165202 (2001).
[pdf]
- 7. "Vibrational
Properties of Tin
Clathrate Materials," C.W. Myles, J. Dong, O.F. Sankey, G.S. Nolas,
- and C.A.
Kendziora, Physical Review B
65,
235208 (2002). [pdf]
- 8. "Large
Supercell Molecular
Dynamics Study of Defect Formation in Hydrogenated Amorphous Si," C.W.
Myles,
- B.C. Ha, and
Y.K. Park, Journal
of the Physics &
Chemistry of Solids 63, 1691 (2002). [pdf]
- 9. "Theoretical
Study of
Rattling Atoms and their Influence on the Lattice Thermal Conductivity
in
-
Clathrate-Framework Semiconductors," O.F.
Sankey, J.J. Dong,
and C.W. Myles, Materials
Research
-
Society Symposium 691, G14.1 (2002). [pdf]
- 10. "Cs 'Rattlers' in
Sn-Based
Clathrate Semiconductors," C.W.
Myles, J.J. Dong, and O.F. Sankey,
Proc.
3rd
-
Motorola Workshop
on Computational Materials Science, 53 (2002). [pdf]
- 11. "GaAs and Si FET-Type
Switches for Repetitive Pulsed Power Applications," X.
Gu, C.W. Myles, A. Kuthi,
- Q.
Shui, and M.A.
Gundersen, Proc. 25th
International Power Modulator Conference, 437 (2002). [pdf]
- 12. "Raman
Scattering Study of
Stoichiometric Si
and Ge Type
II Clathrates" G.S.
Nolas, C.A.
Kendziora, J. Gryko,
- J. Dong,
C.W. Myles, A. Poddar,
and O.F. Sankey, Journal
of Applied Physics 92, 7225
(2002). [pdf]
- 13. "Rattling
Guest Atoms in Si, Ge,
and Sn-based
Type II
Clathrate Materials," C.W.
Myles, J.J. Dong, and
- O.F.
Sankey, Physica
Status
Solidi B 239, 26 (2003). [pdf]
- 14. "Experimental
and
Theoretical Characterization of Na and Rb Doped Si Clathrates," G. Ramachandran,
- W.F.
McMillan, J.J. Dong, O.F. Sankey,
and C.W. Myles, Journal
of Solid State
Chemistry 174,
-
285 (2003).
[pdf]
- 15. "Simulations
of a High Power 4H-SiC
VJFET and it's GaAs
Counterpart," Q. Shui, X. Gu, C.W. Myles
- M.S.
Mazzola, and
M.A.
Gundersen, Proc.
14th International IEEE Pulsed Power Conference,
I,
-
123 (2003).
[pdf]
- 16. "A
Collective Theory of
Lock-on in Photoconductive
Semiconductor Switches," K. Kambour,
H.P. Hjalmarson,
- and C.W. Myles, Proc. 14th International
IEEE Pulsed Power Conference,
I, 345
(2003).
[pdf]
- 17.
"Comparison
of Si, GaAs, SiC,
and GaN
FET-Type Switches for Pulsed Power Applications," X. Gu,
Q.
Shui,
- C.W.
Myles,
and
M.A. Gundersen, Proc.
14th International
IEEE Pulsed Power Conference, I,
-
362 (2003). [pdf]
- 18. "Theory
of
Optically-Triggered Electrical Breakdown
in Semiconductors," K. Kambour, H.P. Hjalmarson,
- and C.W. Myles,
Proc. 2003
IEEE
Conference on Electrical Insulation & Dielectric Phenomena,
-
354 (2003). [pdf]
- 19. "Investigation
of 4H-SiC
MIS Capacitors with TiO2 and Al2O3
as
Gate Insulators," Q. Shui, M.S.
Mazzola,
- X. Gu,
C.W.
Myles, and M.A.
Gundersen, Proc.
26th
International Power Modulator Conference,
-
251 (2004). [doc]
- 20. "Thermal-Electric
Field
Distribution Around Contact/Semi-insulating GaAs
Interfaces in
Photoconductive
-
Semiconductor Switches,"
X. Gu,
M.A. Gundersen, A.
Mar, C.W. Myles,
-
Proc. 26th International Power Modulator
Conference, 345 (2004). [doc]
- Refereed
Publications, 2005-2009
<<
Research Page
<< Charles W.
Myles' Homepage